En jämförande analys av fördelar och nackdelar med atomkraftsmikroskopi och svepelektronmikroskopi
Atomkraftsmikroskopi är ett svepprobmikroskop utvecklat utifrån grundprincipen för sveptunnelmikroskopi. Atomkraftsmikroskopi kan undersöka många prover och tillhandahålla data för ytforskning och produktionskontroll eller processutveckling som konventionella skanningsinstrument för ytjämnhet och elektronmikroskop inte kan ge. Så vad är för- och nackdelarna mellan de två? Låt oss ta en titt på följande:
1. Fördelar:
Atomic force microscopy has many advantages over scanning electron microscopy. Unlike electron microscopes, which can only provide two-dimensional images, atomic force microscopes provide true three-dimensional surface maps. At the same time, AFM does not require any special treatment of the sample, such as copper plating or carbon, which can cause irreversible damage to the sample. Third, electron microscopes need to operate under high vacuum conditions, and atomic force microscopes can work well under normal pressure and even in liquid environments. This can be used to study biological macromolecules and even living biological tissues.
2. Nackdelar:
Compared with scanning electron microscope (SEM), the disadvantage of atomic force microscope is that the imaging range is too small, the speed is too slow, and it is too affected by the probe. Atomic force microscopy is a new type of instrument with atomic-level high resolution invented after scanning tunneling microscopy. It can probe the physical properties of various materials and samples in nanometer regions, including morphology, in atmospheric and liquid environments, or directly conduct nanoscale measurements. Manipulation; it has been widely used in the fields of semiconductor, nano-functional materials, biology, chemical industry, food, medicine research and research experiments of various nano-related disciplines in scientific research institutes, and has become a basic tool for nano-science research. Compared with scanning tunneling microscopy, atomic force microscopy has wider applicability because it can observe non-conductive samples. The scanning force microscope, which is widely used in scientific research and industry, is based on the atomic force microscope.
